References
JN Chapman, WAP Nicholson, and PA Crozier. Understanding thin film x-ray spectra. Journal of Microscopy, 136(2):179–191, 1984.
Francisco de la Peña, Eric Prestat, Vidar Tonaas Fauske, Pierre Burdet, Jonas Lähnemann, Petras Jokubauskas, Tom Furnival, Magnus Nord, Tomas Ostasevicius, Katherine E. MacArthur, Duncan N. Johnstone, Mike Sarahan, Joshua Taillon, Thomas Aarholt, pquinn-dls, Vadim Migunov, Alberto Eljarrat, Jan Caron, Carter Francis, T. Nemoto, Timothy Poon, Stefano Mazzucco, actions-user, Nicolas Tappy, Niels Cautaerts, Suhas Somnath, Tom Slater, Michael Walls, Florian Winkler, and Håkon Wiik Ånes. Hyperspy/hyperspy: release v1.7.3. October 2022. URL: https://doi.org/10.5281/zenodo.7263263, doi:10.5281/zenodo.7263263.
F Scholze and M Procop. Modelling the response function of energy dispersive x-ray spectrometers with silicon detectors. X-Ray Spectrometry: An International Journal, 38(4):312–321, 2009.
Adrien Teurtrie, Nathanaël Perraudin, Thomas Holvoet, Hui Chen, Duncan TL Alexander, Guillaume Obozinski, and Cécile Hébert. Espm: a python library for the simulation of stem-edxs datasets. Ultramicroscopy, pages 113719, 2023.